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Development of a Rapid Profilometery with an Application to Roundness Gauging

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Development of a Rapid Profilometery with an Application to Roundness Gauging

  • Macroscale Metrology

This paper presents the development of a real-time, contact-based, high frequency, response profilometer employed as a roundness gauge for measuring circular form error for 100% part inspection on the shop floor with an accuracy of better than 0.5 μm with measurement times of less than 1 s.

Published in: Precision Engineering

Year: 2006

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